From defect reduction to reduction of waste and customer/stakeholder satisfaction (understanding the new TQM metrology

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Main Authors: DAHLGAARD, Jens J. 2661, DAHLGAARD, Su Mi Park 19633
Format: Períodico
Language:Português
Published: Dece
Online Access:http://bibliotecajuventude.ibict.br/cgi-bin/koha/opac-detail.pl?biblionumber=10781
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